Validating and Debugging DDR2, DDR3 SDRAM Designs -Comprehensive Test solution from Analog to Digital Validation for All DDR Versions
name
title
Memory Design and Validation
Chip/Component Design
Precise understanding of circuit behavior under range of conditions
Margin testing
System Integration
Signal integrity and timing analysis, discovery of issues under nominal conditions
Debug interoperability issues
Embedded Systems
Easy test setup
Quick pass/fail results
DDR Test Challenges
Signal Access & Probing
–Easy-to-use / reliable connections
–Bandwidth & Signal Integrity
–Affordable
Isolation of Read/Write bursts
–Triggering or Post-Processing
Complexity of JEDEC Conformance Tests –Parametric timing/amplitude measurements
–Vref / Vih / Vil, Derating
Results Validity / Statistics
Effective Reporting / Archiving
Advanced Analysis
–Characterization
–Debug
validation verification
Digital Validation & Debug
TLA Logic Analyzers with Nexus
& FuturePlus
Technology memory supports
Verify and debug command
sequence, timing, data, and
more
Analog & Electrical Debug
DPO/DSA real time scopes &
software
Signal integrity measurements
SDRAM Probing Solutions
Easy and reliable physical
connection with minimal
loading Signal Path
Characterization and
Circuit Board Verification
D SA Sampling Oscilloscopes
Verify correct design and
circuit board performance
Fast & Accurate instrument solutions
DDR, DDR2 & DDR3 SDRAM Solutions
Tektronix DDR Test Solutions
DSA70000 Probing and measurement
Software
DSA70000 Probing and measurement
Software
TLA7000, Memory support and probing
solutions
DSA70000 Probing and measurement
Software
TLA7000, Memory support and probing
solutions
TLA7000, Memory support and probing
solutions
DDR 266MHz 333MHz 400MHz DDR2 400MHz 533MHz 667MHz 800MHz 1066MHz
DDR3 800MHz 1066MHz 1333MHz 1600MHz 1867MHz
Analog
Validation & Debug
Digital
Validation & Debug

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