专利名称：BLOCK LAYOUT
发明人：JIYON PEITON BURANKUSU 申请号：JP6920588
申请日：19880323
公开号：JPS63262765A
公开日：
19881031
block truncated
专利内容由知识产权出版社提供
摘要：An initial placement of blocks on a carrier is tested in order to determine whether the placement can be improved by interchanging a first block and a second block by first selecting a terminal of the first block and identifying blocks that are con‐nected to that terminal of the first block. A measure of the half-perimeter of a rectangle bound i ng the positions on the carrier of the first block and the blocks identified as being connected to the first block is computed, and a measure of the half-p erimeter of a second rectangle bounding the posi t ions on the carrier of the second block and the blocks identified as being connected to the first block is computed. The half-perimeter of the sec o nd rectangle is subtracted from the half-perimeter of the first rectangle to yield a difference value. These steps are carried out for all other terminals of the first block and for the second block. The sum of the difference values for the first block is added to the sum of the difference values for the second block to yield a test score. If the test score is negative, the placement is modified by interchanging the first block and the second block.
申请人：TEKTRONIX INC
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