Clause | Requirement – Test | Error/fault | Verdict |
GENERAL Classification | |||
Class C Control functions which are intended to prevent special hazards (e.g., explosion of the controlled equipment). Examples of controls which may include class C functions are: automatic burner controls and thermal cutouts for closed water heater systems (unvented). The definition in EN 60335-1 software class B software that includes code intended to prevent hazards if a fault, other than a software fault, occurs in the appliance software class C software that includes code intended to prevent hazards without the use of other protective devices | |||
Controls with functions declared as software class C shall have one of the following structures: | |||
常用 | -single channel with periodic self-test and monitoring | P | |
不常用 | -dual channel (homogenous) with comparison | N/A | |
不常用 | -dual channel (diverse) with comparison | N/A | |
Example of measures to control faults/errors in a single chip(8 bit) -single channel with periodic self-test and monitoring | |||
1 | CPU Register including (HCS08).register for : | 1. Accumulator (A) 2. Index Register (H:X) 3. Stack Pointer (SP) 4. Program Counter (PC) 5. Condition Code Register | |
CPU Registers | DC fault Stuck at(a fault model representing an open circuit or a non-varying signal level These are usually referred to as "stuck open", "stuck at 1" or "stuck at 0". 代表输出常为“1”或“0” Periodic self-test using walkpat memory test H.2.19.7: 1. Initialize memory to all zeros. 2. Write 1 into location, and read all other locations, to ensure that they still contain all 0s. Verify location 1. 3. Return location 1 to 0, and continue till the end. 4. Repeat all for the walking 0. | ||
1.2 | CPU/instruction decoding and execution | Periodic self-test using equivalence class test with values inside, outside and at the limits of the specified ranges: H.2.18.5 the instructions are grouped as follows: move instructions arithmetic instructions bit and shift instructions conditional instructions other instructions | |
1.3 | CPU/ Programme counter | Independent time slot and logical monitoring H.2.18.10.3 DC Fault | |
1.4 | Addressing of variable memory | Periodic self-test using a testing pattern for address lines | |
5.2 | Addressing of invariable memory Addressing of I/O components | Covered by test of invariable memory I/O address lines covered by I/O tests | |
1.5 | Data path to variable memory | Covered by test of variable memory see 4.2 | |
5.1 | Data path to invariable memory invariable | Covered by test of invariable memory, see 4.1 | |
Data path to I/O components | Covered by I/O tests, see clause 7 | ||
2 | Interrupt handling and execution | Covered by test of 2.3 No interrupt or too frequent interrupt | |
3 | Clock | H.2.18.10 Frequency monitoring | |
4 | IC Memory Sample | ||
4.1 | Memory Invariable memory | CRC – single word (8 bits) | |
4.2 | Variable memory | Redundant memory with software comparison | |
6 | External communication, data and addressing | CRC – double word (16 bit) incorporating data, sources and destination addresses | *N/A |
6.3 | Timing | H.2.18.18 Scheduled transmission | *N/A |
7 | Digital input Digital output | Testing pattern for inputs Output verification H.2.18.22 testing pattern H.2.18.12 output verification | * |
7.2 | Analog input, Multiplexer and A/D-converter | Input comparison (inverted polarity) H.2.18.8 input comparison | |
Other components external to the microcomputer(If it has) | |||
8 | Monitoring device 监控装置 | H.2.18.21 tested monitoring | *N/A |
9 | PLA (Programmable Logic Array) 可编程逻辑电路 | Periodic self-test and monitoring H.2.16.7 single channel with periodic self test and monitoring | *N/A |
客户要提供的资料:
Type of output waveform if other than sinusoidal | X 电子控制的输出波形。(正弦波除外) | ||
Type of output waveform(s) produced after failure of an electronic device or other circuit component (see item g) of H.27.1.3) | X 电子元件失效后的输出波形(输出脚) | ||
The effect on controlled output(s) after electronic circuit component failure if relevant (item c) of H.27.1.3) | X 电子元件失效后的对输出控制的影响 | ||
Category (surge immunity) | X EMC 抗电涌的等级 | ||
Software sequence documentation | X 软件运行顺序的文件(因包括控制原理,控制流程,数据流及时间选择) | ||
Programme documentation | X 编程文件 | ||
Software class(es) and structure | D 软件类型的声明 | ||
Software fault/error detection time(s) for controls of software classes B or C | X 软件的故障发现时间(可以从编程文件上看出来) | ||
Control response(s) in case of detected fault/error | X 故障发现后,控制的反映时间 | ||
Temperature limits of mounting surfaces ( Ts) | |||
Method of mounting control | |||
“D” means the requirement must have supplied document to support.
“X” means the requirement just need declaration from client.
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